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#1

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

Категория: Техника, Электроника, СБИС

6.82 Mb

#2

Power-Aware Testing and Test Strategies for Low Power Devices

Patrick Girard, Nicola Nicolici, Xiaoqing Wen

4.52 Mb

#3

VLSI Test Principles and Architectures: Design for Testability

Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

Категория: engeneering_technology

5.66 Mb

#4

VLSI Test Principles and Architectures: Design for Testability

Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

22.99 Mb

#5

VLSI Test Principles and Architectures: Design for Testability

Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

6.03 Mb